The effect of thermal treatment on the fracture properties of alloy X-750 in aqueous environments

Alloy X-750 is a high strength, age hardenable nickel-base alloy used in light water nuclear reactors. The excellent corrosion resistance and high temperature strength of alloy X-750 make it suitable for use in a variety of structure components in both pressurized water reactors and boiling water reactors. These applications involve exposure of highly stressed material to aqueous media. Operational stresses are subject to low frequency thermally induced fluctuations and high frequency flow induced fluctuations. In general, alloy X-750 has performed well in light water reactors. However, an economically significant number of components have failed unexpectedly due to localized forms of attack such as corrosion fatigue and stress corrosion cracking. Thermal processing history is known to play a significant role in the fracture properties of alloy X-750 in aqueous environments. While thermal treatments have been developed recently to improve performance, in many cases the reason for improved performance remains unclear. Therefore, identification of the mechanisms responsible for the degradation of fracture properties in aqueous environments is necessary. As a corollary it is necessary to achieve an understanding of how thermal treatment influences microstructure and, in turn, how microstructure influences fracture properties in aqueous environments. This report discusses five thermal treatments which were studied: (1) SA-1 hr at 1093 degree C, (2) AH - 24 hr at 885 degree C + 20 hr at 704 degree C, (3) HTH - 1 hr at 1093 degree C + 20 hr at 704 degree C, (4) AHTH - 1 hr at 1093 degree C + 24 hr at 885 degree C + 20 hr at 704 degree C, and (5) HOA - 1 hr at 1093 degree C + 100 hrs at 760 degree C. Microstructural characterization of these materials was accomplished through the use of optical microscopy, transmission electron microscopy,scanning transmission electron microscopy, energy dispersive x-ray spectroscopy, and x-ray diffractometry