Transporting of the beams of charged particles by using dielectric capillaries

A phenomenon of slipping of charged particles beams along the charged dielectric surface can be applied for some practical applications. In general, this is based upon interaction of slipped ion beams with a smooth internal surface of a glass capillary wall. The new systems of transformation, controlling and transporting of charged particle beams could be developed based on this principle. Also, micro- and nanometer size ion beams can be reached that especially have importance for applications in the local elemental and structures analysis, nanolithography, biology, radio-ecology and medicine. Comparing with already existing micrometer size ion techniques the offered method is simpler and chipper. This can simply ensure the method of less than one micrometer size RBS spectroscopy and X-ray analysis. In this paper we present the results of an experimental investigation which demonstrate that dielectric capillaries can significantly enhance the transport efficiency of ion beams through evacuated cavities. The cylindrical glass (boron-silicon) capillaries with a length of 30, 65, 178 mm and a diameter of 0.1 and 0.5 mm were used. (authors)