Performance of an on-demand excitation system for PIXE analysis

A system for electrostatic on-demand beam excitation in PIXE analysis has been built and carefully tested. Significantly increased count rate capability without any need for corrections for electronic dead time and with less target deterioration makes the system superior to a traditional system with electronic pile-up rejection. By adding a fast external electronic pulse pile-up rejection system, a pile-up interval of about 250 ns is obtained. The detailed behaviour of the particle beam during deflection and experience from using the system in routine analysis are reported. (Authors)