Published August 28, 2003
| Version v1
Journal article
Transmission electron microscopy analysis of computer hard disc, magnetic thin films
Creators
Description
As longitudinal magnetic recording media nears the fundamental bit size limit, transmission electron microscopy (TEM) of the microstructure and composition of novel Co-Cr-X media are necessary for further increasing recording density. Grain size determination of B-containing and perpendicular media, and grain boundary segregation are discussed
Additional details
Identifiers
- DOI
- 10.1016/S0254-0584(02)00559-X;
- arXiv
- arXiv:hep-th/0202067v3;
- PII
- S025405840200559X;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 81
- Journal Issue
- 2-3
- Journal Page Range
- p. 241-243
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38075551
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHROMIUM COMPOUNDS; COBALT COMPOUNDS; GRAIN BOUNDARIES; GRAIN DENSITY; SEGREGATION; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ELECTRON MICROSCOPY; FILMS; MICROSCOPY; MICROSTRUCTURE; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.