Published August 28, 2003 | Version v1
Journal article

Transmission electron microscopy analysis of computer hard disc, magnetic thin films

Description

As longitudinal magnetic recording media nears the fundamental bit size limit, transmission electron microscopy (TEM) of the microstructure and composition of novel Co-Cr-X media are necessary for further increasing recording density. Grain size determination of B-containing and perpendicular media, and grain boundary segregation are discussed

Additional details

Identifiers

DOI
10.1016/S0254-0584(02)00559-X;
arXiv
arXiv:hep-th/0202067v3;
PII
S025405840200559X;

Publishing Information

Journal Title
Materials Chemistry and Physics
Journal Volume
81
Journal Issue
2-3
Journal Page Range
p. 241-243
ISSN
0254-0584
CODEN
MCHPDR

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38075551
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CHROMIUM COMPOUNDS; COBALT COMPOUNDS; GRAIN BOUNDARIES; GRAIN DENSITY; SEGREGATION; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ELECTRON MICROSCOPY; FILMS; MICROSCOPY; MICROSTRUCTURE; TRANSITION ELEMENT COMPOUNDS

Optional Information

Copyright
Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.