Published May 10, 1988 | Version v1
Journal article Metadata-only

Atomic near-infrared noble gas scintillations. Pt. 2

Creators

  • 1. Aabo Akademi, Turku (Finland). Accelerator Lab.
  • 2. Aabo Akademi, Turku (Finland). Dept. of Physics
  • 3. Royal Inst. of Tech., Stockholm (Sweden). Dept. of Physics
  • 4. Forskningsinstitutet foer Atomfysik, Stockholm (Sweden)
  • 5. Royal Inst. of Tech., Stockholm (Sweden)
  • 6. Wallac Oy, Turku (Finland)

Description

Results from a study using particle beam exited atomic emission scintillations for monitoring beam intensity are presented. A device suitable for intensity measurements during proton induced X-ray emission analyses was constructed. The light emission was measured with a light-sensitive silicon diode. (orig./HSI)

Additional details

Additional titles

Subtitle (English)
Application to particle beam intensity measurement

Publishing Information

Journal Title
Nucl. Instrum. Methods Phys. Res., Sect. A
Journal Volume
268
Journal Issue
1
Series
Nucl. Instrum. Methods Phys. Res., Sect. A.
Journal Page Range
209-211
ISSN
0168-9002
CODEN
NIMAE

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
19069038
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ARGON; BEAM MONITORING; ION-ATOM COLLISIONS; ION-MOLECULE COLLISIONS; KRYPTON; MEV RANGE 01-10; NEON; NITROGEN; PHOTODIODES; PIXE ANALYSIS; PROTON BEAMS; RESPONSE FUNCTIONS; SCINTILLATIONS; SILICON DIODES; XENON
Descriptors DEC
ATOM COLLISIONS; BEAMS; CHEMICAL ANALYSIS; COLLISIONS; ELEMENTS; ENERGY RANGE; FUNCTIONS; ION COLLISIONS; MEV RANGE; MOLECULE COLLISIONS; MONITORING; NONDESTRUCTIVE ANALYSIS; NONMETALS; NUCLEON BEAMS; PARTICLE BEAMS; RARE GASES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; X-RAY EMISSION ANALYSIS