Published 1993 | Version v1
Book

Ion-assisted deposition of thin films

  • 1. Northwestern Univ., Evanston, IL (United States). Dept. of Materials Science and Engineering and the Materials Research Center

Description

Recent work on low-energy ion-assisted deposition of epitaxial films is reviewed. Much of the recent interest in this area has been centered on the use of very low ion energies (∼ 25 eV) and high fluxes (> 1 ion per deposited atom) obtained using novel ion-assisted deposition techniques. These methods have been applied in ultra-high vacuum, allowing the preparation of high-purity device-quality semiconductor materials. The following ion-surface interaction effects during epitaxy are discussed: improvements in crystalline perfection during low temperature epitaxy, ion damage, improved homogeneity and properties in III-V alloys grown within miscibility gaps, and changes in nucleation mechanism during heteroepitaxial growth

Part of:
Beam processing of advanced materials

Additional details

Publishing Information

Publisher
The Minerals, Metals ampersand Materials Society.
Imprint Place
Warrendale, PA (United States)
ISBN
0-87339-199-3
Imprint Title
Beam processing of advanced materials
Imprint Pagination
730 p.
Journal Page Range
p. 561-577.

Conference

Title
Minerals, Metals, and Materials Society/American Society for Metals (TMS/ASM) materials week '92.
Dates
2-5 Nov 1992.
Place
Chicago, IL (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
25049136
Subject category
S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ENERGY DEPOSITION; FABRICATION; ION BEAMS; NUCLEATION; SEMICONDUCTOR MATERIALS; TECHNOLOGY ASSESSMENT; THIN FILMS; VANADIUM ALLOYS
Descriptors DEC
ALLOYS; BEAMS; FILMS; MATERIALS

Optional Information

Secondary number(s)
CONF-9211117--.