Published March 18, 2014 | Version v1
Journal article

Research on the Testing Methods for IBIS-S System

  • 1. School of Geodesy and Geomatics, Wuhan University, Wuhan (China)
  • 2. Department of geotechnical investigation and surveying, Wuhan Municipal Engineering Design and Research Institute Co. Ltd, Wuhan (China)

Description

The basic theoretical principles and key techniques of the IBIS-S system, which is a micro-deformation monitoring system based on the techniques of GB-InSAR, are introduced. The accuracy of IBIS-S is much higher than that of traditional deformation monitoring devices, so it is necessary to test the accuracy and reliability of the system. Some comparison experiments are designed for testing the parameters provided by the manufacturer, and these tests verify the accuracy and resolution of IBIS-S. A Leica TCRP 1201 total station (with an accuracy of 1mm + 1ppm) and a stepping motor (with an accuracy of 0.001mm) are used for testing the monitoring accuracy of IBIS-S. The results from different tests show that the monitoring data of IBIS-S is very accurate and higher than the traditional total station. The results also indicate that IBIS-S can be applied in the micro-deformation projects of high-rise buildings, bridges and some other objects with a high accuracy

Availability note (English)

Available from http://dx.doi.org/10.1088/1755-1315/17/1/012263

Additional details

Publishing Information

Journal Title
IOP Conference Series: Earth and Environmental Science (EES)
Journal Volume
17
Journal Issue
1
Journal Page Range
[6 p.]
ISSN
1755-1315

Conference

Title
35. international symposium on remote sensing of environment
Acronym
ISRSE35
Dates
22-26 Apr 2013
Place
Beijing (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47054917
Subject category
S54: ENVIRONMENTAL SCIENCES;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; COMPARATIVE EVALUATIONS; DEFORMATION; DESIGN; HIGH-RISE BUILDINGS; IMAGE PROCESSING; MONITORING; RADAR; RELIABILITY; REMOTE SENSING; RESOLUTION; TESTING
Descriptors DEC
BUILDINGS; EVALUATION; MEASURING INSTRUMENTS; PROCESSING; RANGE FINDERS