Published May 2010 | Version v1
Journal article

The 18R and 14H long-period stacking ordered structures in Mg-Y-Zn alloys

  • 1. ARC Centre of Excellence for Design in Light Metals, Department of Materials Engineering, Monash University, Vic 3800 (Australia)
  • 2. CSIRO Materials Science and Engineering, Clayton 3168 (Australia)

Description

The 18R and 14H long-period stacking ordered structures formed in Mg-Y-Zn alloys are examined systematically using electron diffraction and high-angle annular dark-field scanning transmission electron microscopy. In contrast to that reported in previous studies, the 18R structure is demonstrated to have an ordered base-centred monoclinic lattice, with Y and Zn atoms having an ordered arrangement in the closely packed planes. Furthermore, the composition of 18R is suggested to be Mg10Y1Zn1, instead of the Mg12Y1Zn1 composition that is commonly accepted. The 14H structure is also ordered. It has a hexagonal unit cell; the ordered distribution of Y and Zn atoms in the unit cell is similar to that in the 18R and its composition is Mg12Y1Zn1. The 18R unit cell has three ABCA-type building blocks arranged in the same shear direction, while the 14H unit cell has two ABCA-type building blocks arranged in opposite shear directions.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2010.01.022

Additional details

Identifiers

DOI
10.1016/j.actamat.2010.01.022;
PII
S1359-6454(10)00036-4;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
58
Journal Issue
8
Journal Page Range
p. 2936-2947
ISSN
1359-6454
CODEN
ACMAFD

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43039229
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ATOMS; DISTRIBUTION; ELECTRON DIFFRACTION; MAGNESIUM ALLOYS; MONOCLINIC LATTICES; SHEAR; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ALLOYS; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; SCATTERING

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.