Study of the diffraction in the microscope: Annular condenser
Creators
- 1. Consejo Nacional de Investigaciones CientIficas y Tecnicas (CONICET) (Argentina)
- 2. Departamento de Fisica, Facultad de Ingenieria, Universidad de Buenos Aires, Av. Paseo Colon 850, C1063ACV, Buenos Aires (Argentina)
Description
In this work we study the diffraction in the microscope when an annular condenser is used to illuminate the object. We calculate the point spread function (PSF) for a pinhole in an opaque screen illuminated with an annular condenser, consisting in an 1D array of incoherent point sources. We compare it with the PSF for a self-luminous point object, finding that the central disk of the diffraction pattern is narrower and the first intensity minimum is deeper for illuminated objects. We also analyze the resolution of the system by means of the intensity profile produced by two points objects, finding that two self luminous point objects are better resolved than two illuminated objects at the same distance. This suggests that the correlation introduced in the object diminishes the resolution in the former case.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/274/1/012006Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 274
- Journal Issue
- 1
- Journal Page Range
- [5 p.]
- ISSN
- 1742-6596
Conference
- Title
- 17. annual Ibero-American conference on optics (RIAO); 10. Latin American meeting on optics, lasers and applications (OPTILAS)
- Dates
- 20-24 Sep 2010
- Place
- Lima (Peru)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43047043
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; CORRELATIONS; DIFFRACTION; DISTANCE; MICROSCOPES; POINT SOURCES; RESOLUTION; SCREENS
- Descriptors DEC
- COHERENT SCATTERING; EVALUATION; RADIATION SOURCES; SCATTERING; SIMULATION