Published January 1, 2011 | Version v1
Journal article

Study of the diffraction in the microscope: Annular condenser

  • 1. Consejo Nacional de Investigaciones CientIficas y Tecnicas (CONICET) (Argentina)
  • 2. Departamento de Fisica, Facultad de Ingenieria, Universidad de Buenos Aires, Av. Paseo Colon 850, C1063ACV, Buenos Aires (Argentina)

Description

In this work we study the diffraction in the microscope when an annular condenser is used to illuminate the object. We calculate the point spread function (PSF) for a pinhole in an opaque screen illuminated with an annular condenser, consisting in an 1D array of incoherent point sources. We compare it with the PSF for a self-luminous point object, finding that the central disk of the diffraction pattern is narrower and the first intensity minimum is deeper for illuminated objects. We also analyze the resolution of the system by means of the intensity profile produced by two points objects, finding that two self luminous point objects are better resolved than two illuminated objects at the same distance. This suggests that the correlation introduced in the object diminishes the resolution in the former case.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/274/1/012006

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
274
Journal Issue
1
Journal Page Range
[5 p.]
ISSN
1742-6596

Conference

Title
17. annual Ibero-American conference on optics (RIAO); 10. Latin American meeting on optics, lasers and applications (OPTILAS)
Dates
20-24 Sep 2010
Place
Lima (Peru)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43047043
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; CORRELATIONS; DIFFRACTION; DISTANCE; MICROSCOPES; POINT SOURCES; RESOLUTION; SCREENS
Descriptors DEC
COHERENT SCATTERING; EVALUATION; RADIATION SOURCES; SCATTERING; SIMULATION