Published November 12, 2008 | Version v1
Journal article

Fabrication of sub-25 nm diameter pillar nanoimprint molds with smooth sidewalls using self-perfection by liquefaction and reactive ion etching

  • 1. NanoStructure Laboratory, Department of Electrical Engineering, Princeton University, Princeton, NJ 08544 (United States)

Description

Self-perfection by liquefaction (SPEL) was used to fabricate nanoimprint molds with an array of sub-25 nm diameter pillars (200 nm period), resulting in nearly perfect cylindrical shape and smooth sidewalls. SPEL turned an array of irregularly shaped Cr polygons into an array of nearly perfect circular dots with small diameter. The Cr dot arrays were then transferred to SiO2 or Si pillar arrays by means of reactive ion etching to produce imprint molds. High-fidelity nanoimprint lithography using the pillar molds was also demonstrated.

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/19/45/455301

Additional details

Identifiers

DOI
10.1088/0957-4484/19/45/455301;
PII
S0957-4484(08)87013-4;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
19
Journal Issue
45
Journal Page Range
[4 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41013995
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ETCHING; FABRICATION; IONS; LIQUEFACTION; SILICON; SILICON OXIDES
Descriptors DEC
CHALCOGENIDES; CHARGED PARTICLES; ELEMENTS; OXIDES; OXYGEN COMPOUNDS; SEMIMETALS; SILICON COMPOUNDS; SURFACE FINISHING; THERMOCHEMICAL PROCESSES