Published November 12, 2008
| Version v1
Journal article
Fabrication of sub-25 nm diameter pillar nanoimprint molds with smooth sidewalls using self-perfection by liquefaction and reactive ion etching
Creators
- 1. NanoStructure Laboratory, Department of Electrical Engineering, Princeton University, Princeton, NJ 08544 (United States)
Description
Self-perfection by liquefaction (SPEL) was used to fabricate nanoimprint molds with an array of sub-25 nm diameter pillars (200 nm period), resulting in nearly perfect cylindrical shape and smooth sidewalls. SPEL turned an array of irregularly shaped Cr polygons into an array of nearly perfect circular dots with small diameter. The Cr dot arrays were then transferred to SiO2 or Si pillar arrays by means of reactive ion etching to produce imprint molds. High-fidelity nanoimprint lithography using the pillar molds was also demonstrated.
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/19/45/455301Additional details
Identifiers
- DOI
- 10.1088/0957-4484/19/45/455301;
- PII
- S0957-4484(08)87013-4;
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 19
- Journal Issue
- 45
- Journal Page Range
- [4 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41013995
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ETCHING; FABRICATION; IONS; LIQUEFACTION; SILICON; SILICON OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; ELEMENTS; OXIDES; OXYGEN COMPOUNDS; SEMIMETALS; SILICON COMPOUNDS; SURFACE FINISHING; THERMOCHEMICAL PROCESSES