Published April 2018 | Version v1
Journal article

Local low rank denoising for enhanced atomic resolution imaging

  • 1. Department of Physics and Astronomy, Uppsala University, Box 516, S-751 20, Uppsala (Sweden)
  • 2. Oak Ridge National Laboratory, Center for Nanophase Materials Sciences, Oak Ridge, TN 37831 (United States)
  • 3. Oak Ridge National Laboratory, Materials Sciences and Technology Division, Oak Ridge, TN 37831 (United States)
  • 4. School of Physical Sciences, CAS Key Laboratory of Vacuum Sciences, University of Chinese Academy of Sciences, Beijing 100049 (China)

Description

Highlights: • Local low rank denoising is introduced for noisy images and spectrum images. • LLR enables accurate denoising also of spatially complex samples. • Using LLR row wise distortion in STEM images are visualized. • EELS maps of Co2FeO4 are drastically improved by applying LLR. - Abstract: Atomic resolution imaging and spectroscopy suffers from inherently low signal to noise ratios often prohibiting the interpretation of single pixels or spectra. We introduce local low rank (LLR) denoising as tool for efficient noise removal in scanning transmission electron microscopy (STEM) images and electron energy-loss (EEL) spectrum images. LLR denoising utilizes tensor decomposition techniques, in particular the multilinear singular value decomposition (MLSVD), to achieve a denoising in a general setting largely independent of the signal features and data dimension, by assuming that the signal of interest is of low rank in segments of appropriately chosen size. When applied to STEM images of graphene, LLR denoising suppresses statistical noise while retaining fine image features such as scan row-wise distortions, possibly related to rippling of the graphene sheet and consequent motion of atoms. When applied to EEL spectra, LLR denoising reveals fine structures distinguishing different lattice sites in the spinel system CoFe2O4.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2018.01.012

Additional details

Identifiers

DOI
10.1016/j.ultramic.2018.01.012;
PII
S030439911730325X;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
187
Journal Page Range
p. 34-42
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
50052227
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ELECTRON SPECTRA; ENERGY LOSSES; GRAPHENE; IMAGES; SIGNALS; SIGNAL-TO-NOISE RATIO; SPATIAL RESOLUTION; SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
CARBON; DIMENSIONLESS NUMBERS; ELECTRON MICROSCOPY; ELEMENTS; LOSSES; MICROSCOPY; NONMETALS; RESOLUTION; SPECTRA

Optional Information

Copyright
Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.