Assessment of the potential for dating secondary calcite and quartz in fault zones
- 1. Societe de consultation FAJM Inc.
Description
Calcite and quartz occur frequently as secondary minerals in faults. In many instances these minerals are not deformed. Calcite, for example, often exhibits an undisturbed fibrous habit or appears as euhedral crystals. Direct dating of euhedral crystals would provide a minimum age of the last movement along a fault, whereas dating of fibrous crystals would furnish the real age of the last movement. This information would be essential in the evaluation and selection of sites for both nuclear power reactors and nuclear waste disposal. In the Canadian context, to be successful, the technique should be able to date minerals as old as tens of millions of years. In this study both isotopic and radioactive damage techniques were considered. It was found that thermoluminescence, thermally stimulated current, and electron spin resonance offer possibilities. Recent electron spin resonance studies of ancient flints have yielded dates of several hundred million years. It is anticipated that in the near future a combination of the above techniques will be extensively used in the field of geochronology
Availability note (English)
MF available from INIS under the Report Number.Files
15005149.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 75 p.
- Report number
- INFO--0073
INIS
- Country of Publication
- Canada
- Country of Input or Organization
- Canada
- INIS RN
- 15005149
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- AGE ESTIMATION; CALCITE; ELECTRIC CURRENTS; ELECTRON SPIN RESONANCE; FISSION TRACKS; GEOLOGIC FAULTS; QUARTZ; REVIEWS; THERMOLUMINESCENCE
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; CALCIUM CARBONATES; CALCIUM COMPOUNDS; CARBON COMPOUNDS; CARBONATES; CHALCOGENIDES; CURRENTS; DOCUMENT TYPES; GEOLOGIC STRUCTURES; LUMINESCENCE; MAGNETIC RESONANCE; OXIDES; OXYGEN COMPOUNDS; PARTICLE TRACKS; RESONANCE; SILICON COMPOUNDS; SILICON OXIDES
Optional Information
- Notes
- 60 refs.