Published August 1, 2020 | Version v1
Journal article

Effect of surface patterning using femtosecond laser on micromechanical and structural properties of micromechanical sensors

  • 1. Research Chair for Tribology, Surface, and Interface Sciences, Department of Physics and Astronomy, College of Science, King Saud University, Riyadh 11451 (Saudi Arabia)
  • 2. Department of Physics, College of Science, Taif University, Taif (Saudi Arabia)

Description

A femtosecond laser can be used to fabricate microstructures on a silicon microcantilever surface with high precession and minimal sidewall defects. The aim of this study is to investigate the effect of the creation of microgrooves and sub-microgrooves on the resonance frequency, quality factor, and spring constant of a silicon microcantilever. A single pass of a femtosecond laser with a wavelength of 1026 nm was used to fabricate microgrooves on the microcantilever surface. Different numbers of microgrooves were fabricated on each microcantilever using the femtosecond laser micromachining technique. The separation distance between the center of the two microgrooves was 7 μm. The microstructure of the fabricated microgrooves was investigated through field emission electron microscopy. The resonance frequency increased with the number of microgrooves, but the quality factor of the patterned microcantilever was higher than that of the unpatterned microcantilever. The spring constant increased with the number of microgrooves, increasing from 18.96 to 38.04 mN/m for microcantilevers with 1 and 7 microgrooves, respectively. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/2053-1591/ababbd

Additional details

Identifiers

Publishing Information

Journal Title
Materials Research Express (Online)
Journal Volume
7
Journal Issue
8
Journal Page Range
[9 p.]
ISSN
2053-1591

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52099011
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ELECTRON EMISSION; ELECTRON MICROSCOPY; FIELD EMISSION; LASER BEAM MACHINING; MICROSTRUCTURE; QUALITY FACTOR; SILICON; WAVELENGTHS
Descriptors DEC
DIMENSIONLESS NUMBERS; ELEMENTS; EMISSION; MACHINING; MICROSCOPY; SEMIMETALS