Published December 2, 2002 | Version v1
Journal article

Deep-going reconstruction of Ir(100)-5x1

  • 1. Lehrstuhl fuer Festkoerperphysik, Universitaet Erlangen-Nuernberg, Staudtstr. 7, D-91058 Erlangen (Germany)

Description

We present a new investigation of the metastable 1x1 and reconstructed 5x1 phases of Ir(100) using quantitative low-energy electron diffraction and scanning tunnelling microscopy. It is shown that the 5x1 reconstruction of Ir(100) extends up to the fourth layer into the surface. This structural information is retrieved by the use of electron energies up to 600 eV which simultaneously provides an unusually broad database of more than 10.000 eV. Together with an excellent quality of the theory-experiment fit equivalent to an R-factor of RP=0.144 this allows for rather small error limits of the as many as 17 structural parameters describing the four-layer reconstructed surface. Similar features hold for the 1x1 phase which is analysed in parallel. In addition, we present a systematic investigation of the influence of the electron energy range applied and of the allowed depth of reconstruction on the accuracy of the analysis. It appears that for the case of Ir(100)-5x1 the structural parameters describing the top two layers are largely independent from the consideration of the reconstruction of deeper layers

Availability note (English)

Available online at http://stacks.iop.org/0953-8984/14/12353/c24710.pdf or at the Web site for the Journal of Physics. Condensed Matter (ISSN 1361-648X) http://www.iop.org/

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Physics. Condensed Matter
Journal Volume
14
Journal Issue
47
Journal Page Range
p. 12353-12365
ISSN
0953-8984
CODEN
JCOMEL

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
34031289
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
CRYSTALS; ELECTRON DIFFRACTION; IRIDIUM; LAYERS; R FACTORS; SCANNING TUNNELING MICROSCOPY
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELEMENTS; METALS; MICROSCOPY; PLATINUM METALS; REFRACTORY METALS; SCATTERING; TRANSITION ELEMENTS