Published October 2014 | Version v1
Journal article

Inverse Gaussian process models for degradation analysis: A Bayesian perspective

  • 1. School of Mechanical, Electronic, and Industrial Engineering, University of Electronic Science and Technology of China, Chengdu 611731, Sichuan (China)
  • 2. Department of Mechanical Engineering, University of Alberta, Edmonton, AB, Canada T6G 2G8 (Canada)

Description

This paper conducts a Bayesian analysis of inverse Gaussian process models for degradation modeling and inference. Novel features of the Bayesian analysis are the natural manners for incorporating subjective information, pooling of random effects information among product population, and a straightforward way of coping with evolving data sets for on-line prediction. A general Bayesian framework is proposed for degradation analysis with inverse Gaussian process models. A simple inverse Gaussian process model and three inverse Gaussian process models with random effects are investigated using Bayesian method. In addition, a comprehensive sensitivity analysis of prior distributions and sample sizes is carried out through simulation. Finally, a classic example is presented to demonstrate the applicability of the Bayesian method for degradation analysis with the inverse Gaussian process models

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ress.2014.06.005

Additional details

Identifiers

DOI
10.1016/j.ress.2014.06.005;
PII
S0951-8320(14)00127-6;

Publishing Information

Journal Title
Reliability Engineering and System Safety
Journal Volume
130
Journal Page Range
p. 175-189
ISSN
0951-8320
CODEN
RESSEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46099908
Subject category
S42: ENGINEERING;
Descriptors DEI
DISTRIBUTION; FORECASTING; GAUSSIAN PROCESSES; INFORMATION; RANDOMNESS; SENSITIVITY ANALYSIS; SIMULATION

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.