Published April 1, 2021 | Version v1
Journal article

Enhancing the optical absorption, conductivity, and nonlinear parameters of PVOH films by Bi-doping

  • 1. Research Center for Advanced Materials Science (RCAMS), King Khalid University, Abha 61413, P.O. Box 9004 (Saudi Arabia)
  • 2. Physics Department, Faculty of science, Zagazig University, 44519 Zagazig (Egypt)

Description

New polymeric nanocomposite films of PVOH (polyvinyl alcohol) embedded with Bi-nanoparticles have been described by scanning electron microscopy and x-ray diffractometer. From UV-visible spectroscopy, the absorption edge shifts to the higher wavelengths direction (redshift). Tauc's model for optical bandgap transitions demonstrates that the direct and indirect values are reduced with the increase of Bi percentage in the PVOH matrix. In contrast, Urbach energy (tail bandwidth), extinction coefficient, refractive index, and optical conductivity are increased. These indicate the rise of the charge transfer among the Bi nanoparticles and the macromolecules of the matrix. Using Wemple–Di Domenico model for single-oscillator, we calculated the nonlinear optical refractive index and susceptibility. The optical limiting characteristic has been tested via a green laser source of wavelength 533 nm. The present results offer new materials for optical Cut-Off and nonlinear optical applications. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1367-2630/abe614

Additional details

Identifiers

Publishing Information

Journal Title
New Journal of Physics
Journal Volume
23
Journal Issue
4
Journal Page Range
[12 p.]
ISSN
1367-2630

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
53096128
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
NANOCOMPOSITES; NANOPARTICLES; NONLINEAR PROBLEMS; OSCILLATORS; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; WAVELENGTHS
Descriptors DEC
ELECTRON MICROSCOPY; ELECTRONIC EQUIPMENT; EQUIPMENT; MATERIALS; MICROSCOPY; NANOMATERIALS; OPTICAL PROPERTIES; PARTICLES; PHYSICAL PROPERTIES