Published May 21, 2005
| Version v1
Journal article
Two-stream stability assessment of intense heavy ion beams propagating in a plasma immersed in an axial magnetic field
Creators
- 1. ATK Mission Research, Albuquerque, NM 87110 (United States)
- 2. Lawrence Berkeley National Laboratory, Berkeley, CA 94729 (United States)
Description
The stability of intense heavy ion beams propagating in preformed plasmas is being assessed for heavy-ion fusion reactor chamber parameters. A dispersion analysis is used to determine unstable two-stream modes for charge- and current-neutralized heavy ion beams propagating in a cold background plasma. Growth rates are compared directly with 2D particle-in-cell simulations. These simulations are also examined to determine saturation amplitudes of the electron thermal energy as well as any deleterious effects on the ion beam
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2005.01.266;
- PII
- S0168-9002(05)00377-3;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 544
- Journal Issue
- 1-2
- Journal Page Range
- p. 389-392
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 15. international symposium on heavy ion inertial fusion
- Acronym
- HIF 2004
- Dates
- 7-11 Jun 2004
- Place
- Princeton, NJ (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37033824
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGES; ELECTRONS; HEAVY IONS; ION BEAMS; MAGNETIC FIELDS; PARTICLES; PLASMA; SIMULATION; STABILITY; THERMONUCLEAR REACTORS; TWO-STREAM INSTABILITY
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ELEMENTARY PARTICLES; FERMIONS; INSTABILITY; IONS; LEPTONS; PLASMA INSTABILITY; PLASMA MICROINSTABILITIES
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.