Published April 2007 | Version v1
Journal article

Theoretical modelling and implementation of elastic modulus measurement at the nanoscale using atomic force microscope

  • 1. Veeco Instruments, Inc., 112 Robin Hill Road, Santa Barbara, CA 93117 (United States)
  • 2. Dow Chemical Company, Analytical Sciences 1897E Building, Midland, MI 48667 (United States)

Description

Quantitative studies of mechanical behaviour and primarily elastic modulus are essential for material science at the nanometer scale. AFM nanoindentation is the most promising approach to address the problem. In our study we perform AFM-based nanoindentation (deflection-versus-distance curves) on a set of polymer materials with microscopic moduli ranging from 1 MPa to 10 GPa. The measurements were done with probes of different tip shapes and force levels from 100 nN to 3 μN. The tip geometry was evaluated from TEM and SEM micrographs and piecewise linearly interpolated for the use of analysis software; probe spring constant was determined from thermal tune data. The comparative analysis of nanoindentation data was carried out using models of Sneddon and Oliver-Pharr. We derived Sneddon's integrals in closed form for any practical tip shape using a piecewise linear interpolation. Oliver-Pharr's method to account for plasticity for the unloading curve was adapted for Sneddon's integrals. An interactive software implementation with both models was developed and applied

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
61
Journal Issue
1
Journal Page Range
p. 1303-1307
ISSN
1742-6596

Conference

Title
International conference on nanoscience and technology
Dates
30 Jul - 4 Aug 2006
Place
Basel (Switzerland)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38078105
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMIC FORCE MICROSCOPY; DISTANCE; ELASTICITY; INTEGRALS; NANOSTRUCTURES; PLASTICITY; POLYMERS; PRESSURE RANGE GIGA PA; PROBES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; UNLOADING
Descriptors DEC
ELECTRON MICROSCOPY; MATERIALS HANDLING; MECHANICAL PROPERTIES; MICROSCOPY; PRESSURE RANGE