Published April 15, 2010
| Version v1
Journal article
The structure and magnetic properties of Cu-doped ZnO prepared by sol-gel method
- 1. Physics College of Jilin Normal University, Jilin Province 136000 (China)
- 2. National Synchrotron Radiation Laboratory, University of Science of Technology of China, Hefei 230029 (China)
Description
The Cu-doped ZnO and pure ZnO powders were synthesized by sol-gel method. The structural properties of the samples were investigated by X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy and X-ray absorption spectroscopy. All the results confirmed that copper ions were well incorporated into the ZnO lattices by substituting Zn sites without changing the wurtzite structure and no secondary phase existed in Cu-doped ZnO nanoparticles. The Zn0.97Cu0.03O nanoparticles exhibited ferromagnetism at room temperature, as established by the vibrating sample magnetometer analysis.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2010.01.118Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2010.01.118;
- PII
- S0169-4332(10)00158-3;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 256
- Journal Issue
- 13
- Journal Page Range
- p. 4162-4165
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44018089
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; COPPER ADDITIONS; CRYSTAL STRUCTURE; DOPED MATERIALS; FERROMAGNETISM; MAGNETIC PROPERTIES; MAGNETIC SEMICONDUCTORS; NANOSTRUCTURES; POWDERS; RAMAN SPECTROSCOPY; SOL-GEL PROCESS; VIBRATING SAMPLE MAGNETOMETERS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY; X-RAY SPECTROSCOPY; ZINC OXIDES
- Descriptors DEC
- ALLOYS; CHALCOGENIDES; COHERENT SCATTERING; COPPER ALLOYS; DIFFRACTION; ELECTRON SPECTROSCOPY; LASER SPECTROSCOPY; MAGNETISM; MAGNETOMETERS; MATERIALS; MEASURING INSTRUMENTS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; SCATTERING; SEMICONDUCTOR MATERIALS; SPECTROSCOPY; TRANSITION ELEMENT ALLOYS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.