Published 1986 | Version v1
Book Metadata-only

Auger electron microanalysis - fundamentals and applications

Creators

  • 1. Deutsche Forschungs- und Versuchsanstalt fuer Luft- und Raumfahrt e.V., Koeln (Germany, F.R.)

Description

The subject is covered under the following headings: introduction into the fundamentals, realization of the analysis and examples for application, and methods of Auger electron spectroscopy. 1057 references, 63 figures, and 9 tables are included

Additional details

Additional titles

Original title (German)
Auger-Elektronen-Mikroanalyse. Grundlagen und Anwendungen

Publishing Information

Publisher
Akademie-Verlag.
Imprint Place
Berlin (German Democratic Republic)
Imprint Title
Applied surface analysis with SIMS, AES, and XPS
Imprint Pagination
300 p.
Journal Page Range
p. 97-220.

INIS

Country of Publication
German Democratic Republic
Country of Input or Organization
German Democratic Republic
INIS RN
18021765
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
AUGER ELECTRON SPECTROSCOPY; DEPTH; ELECTRON MICROPROBE ANALYSIS; QUALITATIVE CHEMICAL ANALYSIS; QUANTITATIVE CHEMICAL ANALYSIS; REVIEWS; SOLIDS; SPATIAL DISTRIBUTION; SURFACES
Descriptors DEC
CHEMICAL ANALYSIS; DIMENSIONS; DISTRIBUTION; DOCUMENT TYPES; ELECTRON SPECTROSCOPY; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; SPECTROSCOPY

Optional Information

Notes
Imprint:Angewandte Oberflaechenanalyse mit SIMS, AES und XPS.