Published June 22, 1984
| Version v1
Journal article
Electrical properties of vanadium films as a function of the annealing temperature
- 1. Technical University of Wroclaw (Poland). Inst. of Physics
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 116
- Journal Issue
- 1-3
- Series
- Thin Solid Films.
- Journal Page Range
- 231
- ISSN
- 0040-6090
Conference
- Title
- 2. International summer school on thin film formation.
- Dates
- 18-24 Sep 1983.
- Place
- Hajduszoboszlo (Hungary).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Switzerland
- INIS RN
- 16009691
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- ANNEALING; ELECTRIC CONDUCTIVITY; ELECTRONS; HIGH TEMPERATURE; MEAN FREE PATH; MEDIUM TEMPERATURE; POLYCRYSTALS; TEMPERATURE DEPENDENCE; THICKNESS; THIN FILMS; ULTRAHIGH VACUUM; VANADIUM
- Descriptors DEC
- CRYSTALS; DIMENSIONS; ELECTRICAL PROPERTIES; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; FILMS; HEAT TREATMENTS; LEPTONS; METALS; PHYSICAL PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Notes
- Published in summary form only.