Published November 2003 | Version v1
Journal article

Compact design of a transmission electron microscope-scanning tunneling microscope holder with three-dimensional coarse motion

  • 1. Experimental Physics, Chalmers University of Technology and Goeteborg University, SE-41296 Goeteborg (Sweden)

Description

A scanning tunneling microscope (STM) with a compact, three-dimensional, inertial slider design is presented. Inertial sliding of the STM tip, in three dimensions, enables coarse motion and scanning using only one piezoelectric tube. Using the same electronics both for scanning and inertial sliding, step lengths of less than 5% of the piezo range were achieved. The compact design, less than 1 cm3 in volume, ensures a low mechanical noise level and enables us to fit the STM into the sample holder of a transmission electron microscope (TEM), while maintaining atomic scale resolution in both STM and TEM imaging

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
74
Journal Issue
11
Journal Page Range
p. 4945-4947
ISSN
0034-6748
CODEN
RSINAK

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36005756
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
DESIGN; MASS RESOLUTION; NOISE; PIEZOELECTRICITY; SAMPLE HOLDERS; SCANNING TUNNELING MICROSCOPY; THREE-DIMENSIONAL CALCULATIONS; TRANSMISSION ELECTRON MICROSCOPY; TUBES
Descriptors DEC
ELECTRICITY; ELECTRON MICROSCOPY; MICROSCOPY; RESOLUTION

Optional Information

Notes
(c) 2003 American Institute of Physics.