Published November 2003
| Version v1
Journal article
Compact design of a transmission electron microscope-scanning tunneling microscope holder with three-dimensional coarse motion
Creators
- 1. Experimental Physics, Chalmers University of Technology and Goeteborg University, SE-41296 Goeteborg (Sweden)
Description
A scanning tunneling microscope (STM) with a compact, three-dimensional, inertial slider design is presented. Inertial sliding of the STM tip, in three dimensions, enables coarse motion and scanning using only one piezoelectric tube. Using the same electronics both for scanning and inertial sliding, step lengths of less than 5% of the piezo range were achieved. The compact design, less than 1 cm3 in volume, ensures a low mechanical noise level and enables us to fit the STM into the sample holder of a transmission electron microscope (TEM), while maintaining atomic scale resolution in both STM and TEM imaging
Additional details
Identifiers
- DOI
- 10.1063/1.1614872;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 74
- Journal Issue
- 11
- Journal Page Range
- p. 4945-4947
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36005756
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DESIGN; MASS RESOLUTION; NOISE; PIEZOELECTRICITY; SAMPLE HOLDERS; SCANNING TUNNELING MICROSCOPY; THREE-DIMENSIONAL CALCULATIONS; TRANSMISSION ELECTRON MICROSCOPY; TUBES
- Descriptors DEC
- ELECTRICITY; ELECTRON MICROSCOPY; MICROSCOPY; RESOLUTION
Optional Information
- Notes
- (c) 2003 American Institute of Physics.