Published February 21, 2004 | Version v1
Journal article

Calculation of focussing quality of the electrostatic mirror objective free of the third-order spherical aberration

Description

The formulas for the coefficients of spherical aberration of axisymmetrical electrostatic electron mirror have been obtained. The technique of excluding from the integrand of high-order derivatives of the potential axial distribution in mirror systems is given. The conditions of elimination of spherical aberration in a three-electrode axisymmetrical mirror consisting of coaxial cylinders of equal diameter are found. Using a method of direct numerical calculations of the exact equations of trajectories, the fifth-order spherical aberration coefficient of a mirror objective was calculated and its limiting resolution was estimated. The calculations show that the resolution of the electrostatic mirror objective under consideration is not worse than that of the best objectives with magnetic lenses. The schematic diagram of a transmission electron microscope with a dark-field image, the objective of which is an electrostatic electron mirror, is presented

Additional details

Identifiers

DOI
10.1016/j.nima.2003.11.122;
PII
S0168900203029966;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
519
Journal Issue
1-2
Journal Page Range
p. 70-75
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
6. international conference on charged particle optics
Dates
21-25 Oct 2002
Place
Greenbelt, MD (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
Mexico
INIS RN
35077866
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DIAGRAMS; ELECTRODES; ELECTROSTATIC MIRRORS; EQUATIONS; GEOMETRICAL ABERRATIONS; IMAGES; LENSES; NUMERICAL SOLUTION; RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ELECTRON MICROSCOPY; INFORMATION; MATHEMATICAL SOLUTIONS; MICROSCOPY; MIRRORS

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.