Synthesis and textural characterization of covalent organic framework-1: Comparison of pore size distribution models
- 1. Faculty of Chemical Engineering, Universiti Teknologi MARA, 40450 Shah Alam, Selangor (Malaysia)
Description
Covalent organic framework-1 (COF-1) has been synthesized and its textural characteristics determined via surface analyzer and scanning electron microscope (SEM). Fourier transform infra-red (FTIR) analysis has also been conducted to determine the types of covalent bonding present in the material. Our customized synthesis procedure yields a COF-1 powder consisting of granular-shaped bulk particles with approximate diameters ranging from 0.5 to 0.8 μm. Results comparison of three established and commonly-used pore size distribution models, namely, Barret-Joyner-Halenda (BJH), Horvath-Kawazoe (HK) and Density Functional Theory (DFT) reveals that the DFT model is the most appropriate model for COF-1 due to limitation of porosity range of the other two models.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchemphys.2010.04.009Additional details
Identifiers
- DOI
- 10.1016/j.matchemphys.2010.04.009;
- PII
- S0254-0584(10)00315-9;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 123
- Journal Issue
- 1
- Journal Page Range
- p. 5-8
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44012536
- Subject category
- S36: MATERIALS SCIENCE; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; CHEMICAL BONDS; COMPARATIVE EVALUATIONS; COVALENCE; DENSITY FUNCTIONAL METHOD; FOURIER TRANSFORMATION; GRANULAR MATERIALS; INFRARED SPECTRA; NANOSTRUCTURES; PARTICLES; POROSITY; POROUS MATERIALS; POWDERS; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTIES; SURFACES
- Descriptors DEC
- CALCULATION METHODS; ELECTRON MICROSCOPY; EVALUATION; INTEGRAL TRANSFORMATIONS; MATERIALS; MICROSCOPY; SPECTRA; SPECTROSCOPY; TRANSFORMATIONS; VARIATIONAL METHODS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.