Published 2012
| Version v1
Journal article
Probing Phonons in Nonpolar Semiconducting Nano wires with Raman Spectroscopy
Creators
- 1. Physics Department, Altoona College, Pennsylvania State University, Altoona, PA 16601 (United States)
- 2. Materials Research Institute, Pennsylvania State University, University Park, PA 16802 (United States)
- 3. Department of Physics and Astronomy, University of Louisville, Louisville, KY 40292 (US)
- 4. Physics Department, Pennsylvania State University, University Park, PA 16802 (US)
- 5. Conn Center for Renewable Energy Research, University of Louisville, Louisville, KY 40292 (US)
Description
We present recent developments in Raman probe of confined optical and acoustic phonons in nonpolar semiconducting nano wires, with emphasis on Si and Ge. First, a review of the theoretical spatial correlation phenomenological model widely used to explain the downshift and asymmetric broadening to lower energies observed in the Raman profile is given. Second, we discuss the influence of local inhomogeneous laser heating and its interplay with phonon confinement on Si and Ge Raman line shape. Finally, acoustic phonon confinement, its effect on thermal conductivity, and factors that lead to phonon damping are discussed in light of their broad implications on nano device fabrication
Additional details
Publishing Information
- Journal Title
- Journal of Nanotechnology
- Journal Volume
- 2012
- Journal Issue
- 2012
- Journal Page Range
- p. 18
- ISSN
- 1687-9511
INIS
- Country of Publication
- Egypt
- Country of Input or Organization
- Egypt
- INIS RN
- 43059138
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ACOUSTIC MICROSCOPY; ASYMMETRY; ATOMIC FORCE MICROSCOPY; CORRELATIONS; ELECTRON PROBES; FABRICATION; HEATING; PHONONS; QUANTUM WELLS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SCATTERING; THEORETICAL DATA; THERMAL CONDUCTIVITY; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DATA; DIFFRACTION; ELECTRON MICROSCOPY; INFORMATION; LASER SPECTROSCOPY; MICROSCOPY; NANOSTRUCTURES; NUMERICAL DATA; PHYSICAL PROPERTIES; PROBES; QUASI PARTICLES; SCATTERING; SPECTROSCOPY; THERMODYNAMIC PROPERTIES