Electrical and optical properties of bismuth sulphotelluride [Bi2(S1-xTex)3] thin films prepared by arrested precipitation technique (APT)
Creators
Description
Semiconducting bismuth sulphotelluride [Bi2(S1-xTex)3] thin films were grown by using initial ingredients bismuth triethanolamine complex, thioacetamide and sodium tellurosulphite in an aqueous alkaline medium. Thin, uniform, tightly adherent and densely packed deposits are obtained by employing arrested precipitation technique (APT). The optical absorption studies revealed that the films have high absorption coefficient with a band to band (direct) type transitions and the energy gap decreased typically from 1.62 eV for pure Bi2S3 down to 0.65 eV for pure Bi2Te3. The transition of the material is found to be band to band direct type. The electrical conductivity measurements showed increase in the conductivity with increased tellurium content (x) in the film. From TEP measurements the films showed n-type of conduction mechanism for all the samples. The thermo power is of the order of μV/K
Additional details
Identifiers
- DOI
- 10.1016/S0254-0584(03)00333-X;
- arXiv
- arXiv:cond-mat/0307401v1;
- PII
- S025405840300333X;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 84
- Journal Issue
- 2-3
- Journal Page Range
- p. 247-250
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38075779
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; BISMUTH COMPLEXES; BISMUTH SULFIDES; BISMUTH TELLURIDES; ELECTRIC CONDUCTIVITY; ENERGY GAP; EV RANGE 01-10; OPTICAL PROPERTIES; PRECIPITATION; THIN FILMS
- Descriptors DEC
- BISMUTH COMPOUNDS; CHALCOGENIDES; COMPLEXES; ELECTRICAL PROPERTIES; ENERGY RANGE; EV RANGE; FILMS; PHYSICAL PROPERTIES; SEPARATION PROCESSES; SORPTION; SULFIDES; SULFUR COMPOUNDS; TELLURIDES; TELLURIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.