Device for the crystallographic study of substances maintained at liquid nitrogen temperature

When a substance to be studied has been submitted to a processing at low temperature, and that no heating can be tolerated between this processing and the X-ray investigation, conventional low temperature devices are difficult to use. Diffraction lines are recorded, as well as Bragg angles between 55 and 88 deg. The authors present a device that allows a sample permanently immersed in liquid nitrogen to be studied, either through its lower part, or as a whole. They describe the operation principle, how a sample is set into place, how measurements are performed. They comment technical characteristics and performance. This device has been used to measure parameters of graphite irradiated at high temperature