Arc erosion properties of WCu material reinforced with TiSiC under different applied voltages
Creators
- 1. School of Chemistry and Materials Engineering, Anhui Key Laboratory of Low Temperature Co-fired Materials, Huainan Normal University, Huainan, 232038 (China)
- 2. School of Materials Science and Engineering, Hefei University of Technology, Hefei, 230009 (China)
- 3. School of Material and Chemical Engineering, Bengbu University, Bengbu, 233030 (China)
Description
Introducing reinforcements is a crucial way to modify WCu electric contacts. Herein, the arc erosion performances of WCu/TiSiC under various direct current voltages are investigated. The eroded microstructures are observed by a 3D laser scanning confocal microscopy and a thermal field emission scanning electron microscope. Compositions of the eroded surfaces are analyzed by a Raman spectroscopy. With the elevated voltages, values of breakdown current, arc duration, arc energy, and arc discharge distance increase, while the breakdown strength decreases. Meanwhile, the eroded regions gradually change from circular shape to irregularly curved corrugations under the elevated voltages. Copper and TiSiC can disperse arc during arc discharge, and the liquid and gas generated by the two phases can make differences in protecting WCu/TiSiC. (© 2023 Wiley‐VCH GmbH)
Availability note (English)
Available from: http://dx.doi.org/10.1002/adem.202300247Additional details
Identifiers
Publishing Information
- Journal Title
- Advanced Engineering Materials
- Journal Volume
- 25
- Journal Issue
- 17
- Journal Page Range
- p. 1-8
- ISSN
- 1438-1656
- CODEN
- AENMFY
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 54111439
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COPPER ALLOYS; DIRECT CURRENT; ELECTRIC ARCS; ELECTRIC CONTACTS; EROSION; FIELD EMISSION; MICROSTRUCTURE; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDES; TITANIUM CARBIDES; TUNGSTEN ALLOYS
- Descriptors DEC
- ALLOYS; CARBIDES; CARBON COMPOUNDS; CURRENTS; ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTRICAL EQUIPMENT; ELECTRON MICROSCOPY; EMISSION; EQUIPMENT; LASER SPECTROSCOPY; MICROSCOPY; SILICON COMPOUNDS; SPECTROSCOPY; TITANIUM COMPOUNDS; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- AID: 2300247