Production and characterization of Se8P2 semiconductor alloy
Description
This work presents a study about the production characterization of the chalcogenic amorphous Se8P2 alloy. The Mechanical Alloying technique was used to prepare the alloy, and some of its physical properties were characterized using EXAFS, x-ray diffraction (XRD), Raman spectroscopy techniques and also techniques based on the photoacoustic effect. Structural simulations based on the Reverse Monte Carlo (RMC) method were also performed. The use of EXAFS measurements and the total structure factor obtained from x-ray diffraction measurements in RMC simulations allowed the determination of structural properties of Se8P2, such as average coordination numbers and interatomic distances, bondangle distribution functions and the partial distribution functions gij(r). EXAFS and XRD also confirmed the amorphization of the alloy. The RMC simulations also provided information about the relative frequency of interatomic pairs. The vibrational modes of Se8P2 were obtained using Raman spectroscopy. Two setups were used to obtain information using the photoacoustic effect, the open photoacoustic cell and the setup for photoacoustic spectroscopy measurements. Through them the thermal diffusivity and the optical gap of Se8P2 were obtained. (author)
Files
51083438.pdf
Files
(4.1 MB)
| Name | Size | Download all |
|---|---|---|
|
md5:8edc3262596e4419c6641662c0f437a1
|
4.1 MB | Preview Download |
Additional details
Additional titles
- Original title (Portuguese)
- Produção e caracterização da liga semicondutora Se8P2
Publishing Information
- Imprint Pagination
- 69 p.
- Report number
- INIS-BR--23083
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 51083438
- Subject category
- S36: MATERIALS SCIENCE; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Thesis
- Descriptors DEI
- ALLOYS; FINE STRUCTURE; MONTE CARLO METHOD; PHOTOACOUSTIC EFFECT; PHYSICAL PROPERTIES; RAMAN SPECTROSCOPY; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- CALCULATION METHODS; COHERENT SCATTERING; DIFFRACTION; LASER SPECTROSCOPY; SCATTERING; SPECTROSCOPY