Synchrotron as a tool: applications of synchrotron radiation in spectroscopy of the solid-state

This article presents the creation principles of the synchrotron radiation and its basic properties. Some applications of the synchrotron radiation in the solid state spectroscopy are discussed. Particularly, the article is devoted to the valence and conduction band structure analysis with application of the reflectivity coefficient analysis and x-ray spectroscopy methods (XAS): x-ray absorption near edge structure (XANES) and x-ray circular magnetic dichroism (XCMD). Also, various methods of the photoemission electron spectroscopy (XPS and UPS): energy distribution curve method (EDC), resonance photoemission spectroscopy (RPES), an analysis of the constant initial and final state energy (CIS and CFS), and angle resolved photoemission spectroscopy (ARPES) are discussed. Additionally, some aspects of the atomic scale local structure for the solid state materials with application of the extended x-ray absorption fine structure (EXAFS) method and the photoelectron spectromicroscopy have been considered. (author)