Published January 1982
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Evidence for bifurcation and universal chaotic behavior in nonlinear semiconducting devices
Description
Bifurcations, chaos, and extensive periodic windows in the chaotic regime are observed for a driven LRC circuit, the capacitive element being a nonlinear varactor diode. Measurements include power spectral analysis; real time amplitude data; phase portraits; and a bifurcation diagram, obtained by sampling methods. The effects of added external noise are studied. These data yield experimental determinations of several of the universal numbers predicted to characterize nonlinear systems having this route to chaos
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS., PC A03/MF A01 as DE82011106.
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Additional details
Publishing Information
- Imprint Pagination
- 34 p.
- Report number
- LBL--13719
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 13700005
- Subject category
- S42: ENGINEERING;
- Descriptors DEI
- ELECTRONIC CIRCUITS; NOISE; NONLINEAR PROBLEMS; SEMICONDUCTOR DEVICES; TRANSISTOR OSCILLATORS; VARIABLE CAPACITANCE DIODES
- Descriptors DEC
- ELECTRONIC EQUIPMENT; OSCILLATORS; SEMICONDUCTOR DIODES