Published October 8, 2008 | Version v1
Journal article

Gallium nitride heterostructures on 3D structured silicon

  • 1. Institut fuer Halbleitertechnik, Hans-Sommer-Strasse 66, 38106 Braunschweig (Germany)
  • 2. Physikalisch Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig (Germany)
  • 3. Paul-Drude-Institut fuer Festkoerperelektronik, Hausvogteiplatz 5-7, 10117 Berlin (Germany)

Description

We investigated GaN-based heterostructures grown on three-dimensionally patterned Si(111) substrates by metal organic vapour phase epitaxy, with the goal of fabricating well controlled high quality, defect reduced GaN-based nanoLEDs. The high aspect ratios of such pillars minimize the influence of the lattice mismatched substrate and improve the material quality. In contrast to other approaches, we employed deep etched silicon substrates to achieve a controlled pillar growth. For that a special low temperature inductively coupled plasma etching process has been developed. InGaN/GaN multi-quantum-well structures have been incorporated into the pillars. We found a pronounced dependence of the morphology of the GaN structures on the size and pitch of the pillars. Spatially resolved optical properties of the structures are analysed by cathodoluminescence

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/19/40/405301

Additional details

Identifiers

DOI
10.1088/0957-4484/19/40/405301;
PII
S0957-4484(08)78779-8;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
19
Journal Issue
40
Journal Page Range
[6 p.]
ISSN
0957-4484