Published July 1, 2019
| Version v1
Journal article
Improving Raman spectra of pure silicon using super-resolved method
- 1. Faculty of Engineering, Holon Institute of Technology (HIT), Holon 5810201 (Israel)
- 2. Department of Chemistry, Bar-Ilan University, Ramat-Gan 52900 (Israel)
- 3. Faculty of Engineering and the Nanotechnology center, Bar-Ilan University, Ramat-Gan 52900 (Israel)
Description
In this paper, we demonstrated a method to super-resolved Raman spectroscopy, which improves the resolution of pure silicon spectra. Experimental investigations were carried out on the spectra of pure silicon. A tunable Fabry–Perot (F-P) filter was added to the classical Raman setup in which measuring the spectra for different states of the F-P filter coupled with decoded experimental results yielded a spectrum of higher resolution having a reduced linewidth in the pure silicon spectrum. Therefore, this method can be very helpful for improving the detection of silicon material in nanostructures using a low resolution Raman spectroscopy system. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/2040-8986/ab2625Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Optics (Online)
- Journal Volume
- 21
- Journal Issue
- 7
- Journal Page Range
- [6 p.]
- ISSN
- 2040-8986
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52026104
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- FABRY-PEROT INTERFEROMETER; LINE WIDTHS; NANOSTRUCTURES; OPTICAL FILTERS; RAMAN SPECTRA; RAMAN SPECTROSCOPY; RESOLUTION; SILICON
- Descriptors DEC
- ELEMENTS; FILTERS; INTERFEROMETERS; LASER SPECTROSCOPY; MEASURING INSTRUMENTS; SEMIMETALS; SPECTRA; SPECTROSCOPY