Published July 1, 2019 | Version v1
Journal article

Improving Raman spectra of pure silicon using super-resolved method

  • 1. Faculty of Engineering, Holon Institute of Technology (HIT), Holon 5810201 (Israel)
  • 2. Department of Chemistry, Bar-Ilan University, Ramat-Gan 52900 (Israel)
  • 3. Faculty of Engineering and the Nanotechnology center, Bar-Ilan University, Ramat-Gan 52900 (Israel)

Description

In this paper, we demonstrated a method to super-resolved Raman spectroscopy, which improves the resolution of pure silicon spectra. Experimental investigations were carried out on the spectra of pure silicon. A tunable Fabry–Perot (F-P) filter was added to the classical Raman setup in which measuring the spectra for different states of the F-P filter coupled with decoded experimental results yielded a spectrum of higher resolution having a reduced linewidth in the pure silicon spectrum. Therefore, this method can be very helpful for improving the detection of silicon material in nanostructures using a low resolution Raman spectroscopy system. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/2040-8986/ab2625

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Optics (Online)
Journal Volume
21
Journal Issue
7
Journal Page Range
[6 p.]
ISSN
2040-8986

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52026104
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
FABRY-PEROT INTERFEROMETER; LINE WIDTHS; NANOSTRUCTURES; OPTICAL FILTERS; RAMAN SPECTRA; RAMAN SPECTROSCOPY; RESOLUTION; SILICON
Descriptors DEC
ELEMENTS; FILTERS; INTERFEROMETERS; LASER SPECTROSCOPY; MEASURING INSTRUMENTS; SEMIMETALS; SPECTRA; SPECTROSCOPY