Published November 15, 2009
| Version v1
Journal article
Fabrication and photoluminescence properties of silicon nanowires with thin surface oxide layers
- 1. College of Physical Science and Technology, HuaZhong Normal University, Wuhan 430079 (China)
Description
Si nanowires have been synthesized by a novel oxide-assistant growth mechanism using boron powder and silicon oxide as reactants. Their structures and morphologies have been investigated using X-ray diffraction, scanning and transmission electron microscopy, energy-dispersive X-ray spectroscopy, and electron energy loss spectroscopy. The obtained nanowire consists of a single-crystalline Si core and a very thin amorphous boron oxide layer. Photoluminescence investigations reveal that the Si nanowires possess a broad red emission band. The outside amorphous oxide layer plays an important role for the luminescence. The study suggests that the Si nanowires can find potential applications in nanoscale electric and optoelectronic devices.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchemphys.2009.07.015Additional details
Identifiers
- DOI
- 10.1016/j.matchemphys.2009.07.015;
- PII
- S0254-0584(09)00398-8;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 118
- Journal Issue
- 1
- Journal Page Range
- p. 125-128
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43069662
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- BORON; BORON OXIDES; ENERGY-LOSS SPECTROSCOPY; FABRICATION; LAYERS; MORPHOLOGY; PHOTOLUMINESCENCE; QUANTUM WIRES; SILICON; SILICON OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- BORON COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; EMISSION; LUMINESCENCE; MICROSCOPY; NANOSTRUCTURES; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; SCATTERING; SEMIMETALS; SILICON COMPOUNDS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.