Published December 2004 | Version v1
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Basic study on electric optical devices for x-rays using piezoelectric single crystals

  • 1. Hokkaido Univ., Graduate School of Engineering, Sapporo, Hokkaido (Japan)
  • 2. National Institute of Advanced Industrial Science and Technology, Dimensional Standard Section, Tsukuba, Ibaraki (Japan)

Description

Basic study about electric optical devices for x-rays was performed using the change of Bragg diffraction angles caused by the change of lattice spacing d of a piezoelectric single crystal on applying electric field. In this experiment, an α-quartz was chosen because of its abundant already-known physical properties in spite of low piezoelectricity. Both macroscopic deformation and the change of thickness of an α-quartz were measured when an electric field was applied. On the experiment, x-ray diffraction showed peak shift to the amount of 1.8 minutes, of which the value was one order of magnitude larger than that expected from the calculation of lattice spacing. This fact suggested that not only the change of lattice spacing, but also macroscopic deformation could contribute to the peak shift. Therefore, macroscopic deformation should be taken account of the development of electric optical devices. (Y. Kazumata)

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Part of:
Proceedings of the 8th symposium on JAERI's Reimei research program

Additional details

Publishing Information

Imprint Title
Proceedings of the 8th symposium on JAERI's Reimei research program
Imprint Pagination
225 p.
Journal Page Range
p. 207-212
Report number
JAERI-Conf--2004-014

Conference

Title
8. symposium on JAERI's Reimei research program
Dates
29-30 Jun 2004
Place
Tokai, Ibaraki (Japan)

Optional Information

Notes
10 refs., 9 figs., 1 tab.; This record replaces 36061067