Basic study on electric optical devices for x-rays using piezoelectric single crystals
- 1. Hokkaido Univ., Graduate School of Engineering, Sapporo, Hokkaido (Japan)
- 2. National Institute of Advanced Industrial Science and Technology, Dimensional Standard Section, Tsukuba, Ibaraki (Japan)
Description
Basic study about electric optical devices for x-rays was performed using the change of Bragg diffraction angles caused by the change of lattice spacing d of a piezoelectric single crystal on applying electric field. In this experiment, an α-quartz was chosen because of its abundant already-known physical properties in spite of low piezoelectricity. Both macroscopic deformation and the change of thickness of an α-quartz were measured when an electric field was applied. On the experiment, x-ray diffraction showed peak shift to the amount of 1.8 minutes, of which the value was one order of magnitude larger than that expected from the calculation of lattice spacing. This fact suggested that not only the change of lattice spacing, but also macroscopic deformation could contribute to the peak shift. Therefore, macroscopic deformation should be taken account of the development of electric optical devices. (Y. Kazumata)
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Additional details
Publishing Information
- Imprint Title
- Proceedings of the 8th symposium on JAERI's Reimei research program
- Imprint Pagination
- 225 p.
- Journal Page Range
- p. 207-212
- Report number
- JAERI-Conf--2004-014
Conference
- Title
- 8. symposium on JAERI's Reimei research program
- Dates
- 29-30 Jun 2004
- Place
- Tokai, Ibaraki (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 36113723
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BRAGG CURVE; BRAGG REFLECTION; COLD NEUTRONS; DEFORMATION; ELECTRIC FIELDS; INTERFEROMETERS; LASERS; LATTICE PARAMETERS; MONOCRYSTALS; OPTICAL EQUIPMENT; PIEZOELECTRICITY; QUARTZ; THICKNESS; X-RAY DIFFRACTION
- Descriptors DEC
- BARYONS; COHERENT SCATTERING; CRYSTALS; DIAGRAMS; DIFFRACTION; DIMENSIONS; ELECTRICITY; ELEMENTARY PARTICLES; EQUIPMENT; FERMIONS; HADRONS; INFORMATION; MEASURING INSTRUMENTS; MINERALS; NEUTRONS; NUCLEONS; OXIDE MINERALS; REFLECTION; SCATTERING
Optional Information
- Notes
- 10 refs., 9 figs., 1 tab.; This record replaces 36061067