X-ray study of Eu-Si and Er-Si compounds

The electronic structure of Eu and Er silicides was studied with the method of X-ray spectroscopy. The experimental results concerning the X-ray L2,3 and K emission spectra of Si, and L spectra of Eu and Er in their silicides (EuSi, EuSi2, ErSi, ErSi2 and Er5Si3) are presented. The results prove the existence of transfer of 3p(s) electrons from vicinity of Si atom to vicinity of rare-earth atom. Also, there are some other conclusions presented about the distribution of valence electrons according to their symmetry, and about the possibility of 4f→5d electronic transfer in rare-earth atoms. 10 refs., 2 figs., 3 tabs. (author)