Published December 2019 | Version v1
Journal article Metadata-only

Mössbauer spectroscopic microscope study on diffusion and segregation of Fe impurities in mc-Si wafer

Creators

  • 1. Shizuoka Institute of Science and Technology (Japan)
  • 2. Nagoya University Furo-cho, Graduate School of Engineering and School of Engineering (Japan)

Description

Fe diffusion and segregation process is studied in mc-Si crystals by "Mössbauer spectroscopic microscope (MSM)", which enables us to measure the Fe diffusion profiles separately for different Fe chemical states in mc-Si with a spatial resolution of several micrometres. This new method opens a possibility to investigate a diffusion process strongly influenced by the interactions and the correlations between Fe impurities and lattice defects such as dislocations, grain boundaries, and residual stresses in different grains of materials.

Additional details

Identifiers

DOI
10.1007/s10751-019-1651-2;

Publishing Information

Journal Title
Hyperfine Interactions
Journal Volume
240
Journal Issue
1
Journal Page Range
p. 1-8
ISSN
0304-3843
CODEN
HYINDN

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
51081159
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
CHEMICAL STATE; CORRELATIONS; CRYSTALS; DIFFUSION; DISLOCATIONS; GRAIN BOUNDARIES; IMPURITIES; INTERACTIONS; IRON ADDITIONS; MOESSBAUER EFFECT; RESIDUAL STRESSES; SEGREGATION; SILICON; SOLAR CELLS; SPATIAL RESOLUTION
Descriptors DEC
ALLOYS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIRECT ENERGY CONVERTERS; ELEMENTS; EQUIPMENT; IRON ALLOYS; LINE DEFECTS; MICROSTRUCTURE; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; RESOLUTION; SEMIMETALS; SOLAR EQUIPMENT; STRESSES; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2019 Springer Nature Switzerland AG