Thickness-dependent magnetic order and phase-transition dynamics in epitaxial Fe-rich FeRh thin films
- 1. College of Electronics and Information, Hangzhou Dianzi University, Hangzhou, 310018 (China)
Description
Highlights: • A control on the magnetic order and phase-transition dynamics by tuning FeRh film thickness was reported. • The decrease of film thicknesses results in an AFM to FM phase change, accompanied by a 0.55% lattice expansion. • Phase transition dynamics are highly dependent on the film thickness. • Phase transition involves in the release and recovery of strain, leading to lower transition temperature in thinner films. • Possible approaches to narrow down the thermal hysteresis are proposed. -- Abstract: The control of magnetic order and phase-transition dynamics by various means is a key towards low-power spintronics. Here, we report a control on magnetic order and phase-transition dynamics by tuning film thickness in epitaxial FeRh films. Reduction of film thicknesses from 200 nm to 5 nm results in an anti-ferromagnetic to ferromagnetic phase change, accompanied by a 0.55% lattice expansion for c-axis. The phase-transition dynamics is highly dependent on the film thickness, and involves the release and recovery of lattice strain that results in a lower transition temperature and larger thermal hysteresis in thinner films. The findings help to understand the origin of thermal hysteresis and phase-transition dynamics in ultra-thin FeRh films. Possible approaches to narrow down thermal hysteresis are proposed.
Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2019.04.058;
- PII
- S0375960119303913;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 383
- Journal Issue
- 20
- Journal Page Range
- p. 2424-2428
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55008170
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; EPITAXY; PHASE TRANSFORMATIONS; THICKNESS; THIN FILMS; TRANSITION TEMPERATURE
- Descriptors DEC
- CRYSTAL GROWTH METHODS; DIMENSIONS; FILMS; MICROSCOPY; PHYSICAL PROPERTIES; THERMODYNAMIC PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2019 Elsevier B.V. All rights reserved.