Published July 2003 | Version v1
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Spectroscopic measurement and evaluation study on soft x-ray optical elements. Development of laminar-type replica grating for a soft x-ray flat field spectrograph

  • 1. Shimadzu Corp., Device Department, Kyoto (Japan)
  • 2. Shimadzu Scientific Research Inc., Tokyo (Japan)
  • 3. Japan Atomic Energy Research Inst., Kansai Research Establishment, Kizu, Kyoto (Japan)

Description

Laminar-type varied-line-spacing gratings had been developed with the holographic method. The performance of the original gratings also had been investigated comparing with mechanically ruled replica gratings and it was found that new gratins have advantages on suppress the higher order light and stray light over the replica gratings. In this study, we fabricated a replica grating from the master holographic grating having a groove density of 1200 lines/mm because of their higher productivity and marketability than the original grating. The diffraction efficiency and the spectral resolution of the replica grating as well as the master holographic grating and the mechanically ruled replica grating were measured in a spectral range of 5-18 nm by use of a synchrotron light source and a laboratory soft X-ray generator emitting the C-K band (4.36 nm), respectively. The replica grating showed equivalent diffraction efficiency and spectral resolution with those of the master grating without significant deterioration due to replication. (author)

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Part of:
Proceedings of the fourth symposium on advanced photon research

Additional details

Publishing Information

Imprint Title
Proceedings of the fourth symposium on advanced photon research
Imprint Pagination
304 p.
Journal Page Range
p. 71-74
Report number
JAERI-Conf--2003-008

Conference

Title
4. symposium on advanced photon research
Dates
28-29 Nov 2002
Place
Kizu, Kyoto (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
36116151
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
EFFICIENCY; EVALUATION; FABRICATION; GRATINGS; HOLOGRAPHY; LABORATORY EQUIPMENT; OPTICAL SYSTEMS; PERFORMANCE TESTING; REPLICAS; SOFT X RADIATION; SPECTROSCOPY
Descriptors DEC
ELECTROMAGNETIC RADIATION; EQUIPMENT; IONIZING RADIATIONS; RADIATIONS; TESTING; X RADIATION

Optional Information

Notes
6 refs., 6 figs.; This record replaces 35019796