Published July 31, 1992 | Version v1
Patent Open

Determination of defect location in material depth

Description

A method is described for locating a defect in the material of an object tested by the radiographic technique. The defect is imaged on a luminescence screen. The screen plane forms an angle of 1deg to 10deg with the plane determined by the ionizing radiation source and the object section evaluated. The line of intersection of the two planes is perpendicular to the ionizing radiation beam axis and lies above it. The image lies in the plane determined by the ionizing radiation source and the object's axis of revolution. The video signal of the image on the screen is stored in the image memory for a preselected time. The object and the camera are rotated about their axes by the same preselected angle within the region of 2deg to 90deg, and the new defect and object image is recorded onto the preceding recording in the image memory. The resulting image of the object section is imaged by retrieving the superimposed video signals from the image memory. (Z.S.). 4 figs

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Additional details

Additional titles

Original title (Czech)
Zpusob zjistovani polohy vady v tloustce materialu

Publishing Information

Imprint Pagination
9 p.
IPC:
Int. Cl. G01N23/04.
IPC
Int. Cl. G01N23/04.
Patent number
CZ patent document 267427/B1/

INIS

Country of Publication
Czech Republic
Country of Input or Organization
Czech Republic
INIS RN
24069731
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Descriptors DEI
DEFECTS; IMAGES; IONIZING RADIATIONS; LUMINESCENCE; NONDESTRUCTIVE TESTING
Descriptors DEC
EMISSION; MATERIALS TESTING; PHOTON EMISSION; RADIATIONS; TESTING

Optional Information