Published June 2010 | Version v1
Journal article

Structure and oscillatory multilayer relaxation of the bismuth (100) surface

  • 1. Department of Physics and Materials Science Program, University of New Hampshire, Durham, NH 03824 (United States)
  • 2. Institute for Storage Ring Facilities and Interdisciplinary Nanoscience Center (iNANO), University of Aarhus, 8000 Aarhus C (Denmark)
  • 3. Donostia International Physics Center (DIPC), 20018 San Sebastian, Basque Country (Spain)
  • 4. Institut fuer Festkoerperforschung and Institute for Advanced Simulation, Forschungszentrum Juelich, D-52425 Juelich (Germany)
  • 5. Departamento de Fisica de Materiales and Centro Mixto CSIC-UPV/EHU, Facultad de Ciencias Quimicas, UPV/EHU, Apdo 1072, 20080 San Sebastian, Basque Country (Spain)

Description

We present a combined experimental and theoretical study of the surface structure of single crystal Bi(100) via scanning tunneling microscopy (STM), low-energy electron diffraction intensity versus energy (LEED-IV) analysis and density functional theory (DFT). We find that the surface is unreconstructed and shows an unusually large oscillatory multilayer relaxation down to the sixth layer. This unexpected behavior will be explained by a novel mechanism related to the deeply penetrating electronic surface states. STM reveals wide (100) terraces, which are separated by two-layer high steps in which the shorter of the two interlayer spacings is terminating this surface, consistent with the LEED structural analysis and DFT.

Availability note (English)

Available from http://dx.doi.org/10.1088/1367-2630/12/6/063016

Additional details

Publishing Information

Journal Title
New Journal of Physics
Journal Volume
12
Journal Issue
6
Journal Page Range
[13 p.]
ISSN
1367-2630

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42066743
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
BISMUTH; DENSITY FUNCTIONAL METHOD; ELECTRON DIFFRACTION; EXPERIMENTAL DATA; LAYERS; MONOCRYSTALS; RELAXATION; SCANNING TUNNELING MICROSCOPY; SURFACES; THEORETICAL DATA
Descriptors DEC
CALCULATION METHODS; COHERENT SCATTERING; CRYSTALS; DATA; DIFFRACTION; ELEMENTS; INFORMATION; METALS; MICROSCOPY; NUMERICAL DATA; SCATTERING; VARIATIONAL METHODS