Interactions of fragment ions of tetradecane with solid surfaces
Description
Vapors of tetradecane (C14H30) were ionized by electron bombardment. The generated fragment ions such as C3H7, C6H13, and C12H25 ions were separated by an E × B filter (Wien filter) and accelerated toward Si(1 0 0) substrates. Thickness measurements showed that thin films were deposited on the Si substrates by C3H7- and C6H13-ion irradiation, although the Si substrate surface was predominantly sputtered by C12H25 ions. Rutherford backscattering spectroscopy showed that the irradiation damage by the fragment-ion beams decreased with the increasing molecular weight of the fragment ions at the same acceleration voltage. Furthermore, Raman spectra as well as X-ray photoelectron spectroscopy measurements showed that DLC films were formed by C3H7- and C6H13-ion irradiation with the film thickness being larger in case of C3H7. On the contrary, for C12H25-ion irradiation, chemical sputtering occurred by surface reactions of hydrogen and methyl radicals with silicon atoms. The chemical reaction at the irradiated substrate surface could be enhanced by the higher temperatures achieved by the high energy–density irradiation effect of the polyatomic ions
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2014.06.029Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2014.06.029;
- PII
- S0168-583X(14)00649-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 341
- Journal Page Range
- p. 48-52
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46129172
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ELECTRIC POTENTIAL; ELECTRON BEAMS; HYDROGEN; INTERACTIONS; ION BEAMS; IONS; IRRADIATION; METHYL RADICALS; MOLECULAR WEIGHT; RAMAN SPECTRA; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON; SPUTTERING; SUBSTRATES; SURFACES; TEMPERATURE RANGE 0400-1000 K; THICKNESS; THIN FILMS; VAPORS; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ALKYL RADICALS; BEAMS; CHARGED PARTICLES; DIMENSIONS; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; FLUIDS; GASES; LEPTON BEAMS; NONMETALS; PARTICLE BEAMS; PHOTOELECTRON SPECTROSCOPY; RADICALS; SEMIMETALS; SPECTRA; SPECTROSCOPY; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.