Published February 2012 | Version v1
Journal article

LSST camera readout chip ASPIC: test tools

  • 1. Laboratoire de Physique Nucléaire et de Hautes Energies/IN2P3/CNRS, 4 place Jussieu, Tour 22 — 1erétage, 75252 Paris Cedex 05 (France)
  • 2. Laboratoire de l'Accélérateur Linéaire/IN2P3/CNRS, BP 34, 91898 Orsay Cedex (France)

Description

The LSST camera will have more than 3000 video-processing channels. The readout of this large focal plane requires a very compact readout chain. The correlated ''Double Sampling technique'', which is generally used for the signal readout of CCDs, is also adopted for this application and implemented with the so called ''Dual Slope integrator'' method. We have designed and implemented an ASIC for LSST: the Analog Signal Processing asIC (ASPIC). The goal is to amplify the signal close to the output, in order to maximize signal to noise ratio, and to send differential outputs to the digitization. Others requirements are that each chip should process the output of half a CCD, that is 8 channels and should operate at 173 K. A specific Back End board has been designed especially for lab test purposes. It manages the clock signals, digitizes the analog differentials outputs of ASPIC and stores data into a memory. It contains 8 ADCs (18 bits), 512 kwords memory and an USB interface. An FPGA manages all signals from/to all components on board and generates the timing sequence for ASPIC. Its firmware is written in Verilog and VHDL languages. Internals registers permit to define various tests parameters of the ASPIC. A Labview GUI allows to load or update these registers and to check a proper operation. Several series of tests, including linearity, noise and crosstalk, have been performed over the past year to characterize the ASPIC at room and cold temperature. At present, the ASPIC, Back-End board and CCD detectors are being integrated to perform a characterization of the whole readout chain.

Availability note (English)

Available from http://dx.doi.org/10.1088/1748-0221/7/02/C02044

Additional details

Publishing Information

Journal Title
Journal of Instrumentation
Journal Volume
7
Journal Issue
02
Journal Page Range
p. C02044
ISSN
1748-0221

Conference

Title
Topical workshop on electronics for particle physics 2011
Acronym
TWEPP-11
Dates
26-30 Sep 2011
Place
Vienna (Austria)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44051371
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANALOG-TO-DIGITAL CONVERTERS; CHARGE-COUPLED DEVICES; INTERFACES; READOUT SYSTEMS; SIGNAL-TO-NOISE RATIO
Descriptors DEC
DIMENSIONLESS NUMBERS; ELECTRONIC EQUIPMENT; EQUIPMENT; SEMICONDUCTOR DEVICES