Published March 2018 | Version v1
Journal article

A new approach for direct imaging of Alpha radiation by using Micro Pattern Gas Detectors in SQS mode

  • 1. Faculty of Science and Modern Technology, Graduate University of Advanced Technology, Kerman (Iran, Islamic Republic of)
  • 2. Faculty of Electrical and Computer Engineering, Graduate University of Advanced Technology, Kerman (Iran, Islamic Republic of)

Description

In this study, the design, simulation and construction of three micro pattern gas-detectors, THGEM, with different geometric dimensions are presented. Moreover, their ability of operation in SQS mode to determine the incident rays position without using any conventional imaging system is investigated. In the presence of UV absorbing gas mixtures, the proportional mode of the gas detector operation is followed by SQS mode as soon as the visible light column appears at the ray entrance location. In the method employed, each THGEM hole as an image pixel independent of other holes can operate in SQS mode with emerging a light column.

d1e325>As a consequence, it can be used for alpha beam imaging since the brightness of each hole at a certain voltage is proportional to the number of primary electrons entering the hole.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2017.11.055

Additional details

Identifiers

DOI
10.1016/j.nima.2017.11.055;
PII
S0168900217312846;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
884
Journal Page Range
p. 128-135
ISSN
0168-9002
CODEN
NIMAER

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
53029449
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ALPHA BEAMS; BRIGHTNESS; ELECTRIC POTENTIAL; GEOMETRY; IMAGES; SIMULATION; VISIBLE RADIATION
Descriptors DEC
BEAMS; ELECTROMAGNETIC RADIATION; HELIUM 4 BEAMS; ION BEAMS; MATHEMATICS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS

Optional Information

Copyright
Copyright (c) 2017 Elsevier B.V. All rights reserved.