High-resolution alpha spectrometry at ambient air pressure—Towards new applications
- 1. STUK—Radiation and Nuclear Safety Authority, P.O. Box 14, FI-00881 Helsinki (Finland)
Description
An approach for alpha spectrometry is introduced that allows measuring alpha spectra at ambient air pressure with energy resolution comparable to measurements in vacuum. The developed prototype equipment uses a semiconductor alpha detector and a honeycomb collimator. Contamination of 1 Bq/cm2 at any smooth and flat surface can be detected in approximately 10 s data acquisition time, but longer time is needed for radionuclide identification. A hand-held instrument for in-situ measurements can be manufactured opening a wide range of novel applications in alpha spectrometry. -- Highlights: ► We present a novel approach to measure alpha spectra at ambient air pressure. ► Energy resolution is comparable to measurements performed in vacuum. ► Radionuclide identification can be performed from smooth and flat surfaces. ► New instruments and applications for in-situ alpha spectrometry are possible.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2012.08.001Additional details
Identifiers
- DOI
- 10.1016/j.nima.2012.08.001;
- PII
- S0168-9002(12)00851-0;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 694
- Journal Page Range
- p. 173-178
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45023113
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AIR; ALPHA SPECTRA; ALPHA SPECTROSCOPY; COLLIMATORS; COMPARATIVE EVALUATIONS; CONTAMINATION; DATA ACQUISITION; ENERGY RESOLUTION; PORTABLE EQUIPMENT; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR MATERIALS; SURFACES
- Descriptors DEC
- EQUIPMENT; EVALUATION; FLUIDS; GASES; MATERIALS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RESOLUTION; SPECTRA; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.