Published February 2010 | Version v1
Journal article

A 12-bit 40 MS/s pipelined ADC with over 80 dB SFDR

  • 1. Department of Electronic Engineering, Tsinghua University, Beijing 100084 (China)

Description

This paper describes a 12-bit 40 MS/s calibration-free pipelined analog-to-digital converter (ADC), which is optimized for high spurious free dynamic range (SFDR) performance and low power dissipation. With a 4.9 MHz sine wave input, the prototype ADC implemented in a 0.18-μm 1P6M CMOS process shows measured differential nonlinearity and integral nonlinearity within 0.78 and 1.32 least significant bits at the 12-bit level without any trimming or calibration. The ADC, with a total die area of 3.1 x 2.1 mm2, demonstrates a maximum signal-to-noise distortion ratio (SNDR) and SFDR of 66.32 and 83.38 dB, respectively, at a 4.9 MHz analog input and a power consumption of 102 mW from a 1.8 V supply. (semiconductor integrated circuits)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/31/2/025007

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
31
Journal Issue
2
Journal Page Range
[5 p.]
ISSN
1674-4926

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42071451
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
Descriptors DEI
ANALOG-TO-DIGITAL CONVERTERS; CALIBRATION; INTEGRATED CIRCUITS; NOISE; NONLINEAR PROBLEMS; SEMICONDUCTOR MATERIALS; SIGNALS
Descriptors DEC
ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; EQUIPMENT; MATERIALS; MICROELECTRONIC CIRCUITS