Published March 2011
| Version v1
Journal article
17 keV photon induced damage of Bi-2212 whiskers by synchrotron μ-beam exposure
- 1. National Institute of Materials Physics, Str. Atomistilor 105 Bis, RO-77125, PO Box MG-7, Magurele-Bucharest (Romania)
- 2. NIS Centre of Excellence, Dipartimento Chimica Generale e Chimica Organica, and CNISM UdR Torino Universita, C.so Massimo D'Azeglio 48, I-10125, Torino (Italy)
- 3. NIS Centre of Excellence, Dipartimento Chimica IFM and INSTM Reference Centre, University of Torino, Via Pietro Giuria 7, I-10125, Torino (Italy)
- 4. NIS Centre of Excellence, Dipartimento Fisica Sperimentale, and CNISM-UdR Torino Universita, Via Pietro Giuria 1, I-10125, Torino (Italy)
Description
Experimental data show that the normal state resistivity of superconducting Bi2Sr2CaCu2O8+δ (Bi-2212) whiskers increases after a 6 h irradiation by a synchrotron μ-beam with 17 keV photons. We analyse this result on the basis of previously reported effects in Bi-2212 whiskers due to ageing or heating processes. A finite element model of the experimental setup clarifies that the heat load induced by the microbeam has to be excluded as a possible cause for the material changes. The knock on the interstitial, loosely bound, O species by secondary electrons is discussed as the most likely mechanism responsible for this effect.
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-2048/24/3/035009Additional details
Identifiers
- DOI
- 10.1088/0953-2048/24/3/035009;
- PII
- S0953-2048(11)67296-5;
Publishing Information
- Journal Title
- Superconductor Science and Technology
- Journal Volume
- 24
- Journal Issue
- 3
- Journal Page Range
- [4 p.]
- ISSN
- 0953-2048
- CODEN
- SUSTEF
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43015769
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- FINITE ELEMENT METHOD; IRRADIATION; PHOTONS; SYNCHROTRONS
- Descriptors DEC
- ACCELERATORS; BOSONS; CALCULATION METHODS; CYCLIC ACCELERATORS; ELEMENTARY PARTICLES; MASSLESS PARTICLES; MATHEMATICAL SOLUTIONS; NUMERICAL SOLUTION