Hybrid organic photodetectors for radiography
Creators
- 1. Siemens AG. Corporate Technologies. Erlangen (Germany)
- 2. Light Technology Institute, Karlsruhe Institute of Technology. Karlsruhe (Germany)
- 3. Institute for Materials for Electronics and Energy Technology, Friedrich-Alexander University. Erlangen (Germany)
Description
Most of todays X-ray detectors are using an indirect conversion mechanism. The X-ray radiation is converted into visible light within a thick scintillator layer. The visible light is then absorbed by standard thin-film photodetectors. The isotropic propagation of light in the scintillator reduces the resolution of the x-ray imager. This work avoids the stacked structure by integration of inorganic PbS quantum dots directly into the bulk hetero junction (BHJ) of an organic photodetector. X-ray photons are immediately converted into charge carriers and travel in direction of the electrical field towards the electrodes. However, this concept demands much thicker organic layers than known from conventional OLED and OPV processing. We demonstrate that thick diodes can be achieved with a spray coating process and the influence of spraying parameters on device performance is discussed.
Additional details
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Regensburg 2013 issue
- Series
- Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 48(3)
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- DPG Spring meeting of the condensed matter section (SKM) together with the divisions microprobes, radiation and medical physics and working groups industry and business, young DPG
- Dates
- 10-15 Mar 2013
- Place
- Regensburg (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 46007204
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRIC FIELDS; FABRICATION; JUNCTION DETECTORS; LEAD SULFIDES; ORGANIC SEMICONDUCTORS; PERFORMANCE; PHOTODETECTORS; QUANTUM DOTS; SEMICONDUCTOR DIODES; SPRAY COATING; X-RAY DETECTION; X-RAY RADIOGRAPHY
- Descriptors DEC
- CHALCOGENIDES; DEPOSITION; DETECTION; INDUSTRIAL RADIOGRAPHY; LEAD COMPOUNDS; MATERIALS; MATERIALS TESTING; MEASURING INSTRUMENTS; NANOSTRUCTURES; NONDESTRUCTIVE TESTING; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS; SULFIDES; SULFUR COMPOUNDS; SURFACE COATING; TESTING
Optional Information
- Notes
- Session: HL 69.18 Mi 16:00; No further information available