Published October 2006 | Version v1
Journal article

Research on the Methods to Compensate the Systematic Error at Optical Autoreflection Angular Measurements

  • 1. Department of Optic-electronics Devices and Systems, State University of Information Technologies, Mechanics and Optics, Kronverkskiy Prospect, 49., St.-Petersburg, 197101 (Russian Federation)

Description

Autoreflection measurement devices have very wide applications in produce of instrument, machine and metrical technology. They are used for ensuring status of details, units and planes, and for the control of the displacement of revolving converters, in the national standard planar angle. The main systematic error in autoreflection measurement methods is an error caused by vignetting. The analytic research of function describing this error was made. The experiment was made to ensure the analytical results. The parameters of experimental device were the following. The distance from the mirror 8 m, aperture of the receiving objective 65 mm, aperture of the mirror 78 mm, diameter of the radiating surface of the LED 2mm

Availability note (English)

Available online at http://stacks.iop.org/1742-6596/48/932/jpconf6_48_176.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
48
Journal Issue
1
Journal Page Range
p. 932-936
ISSN
1742-6596

Conference

Title
International symposium on instrumentation science and technology
Dates
8-12 Aug 2006
Place
Harbin (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38033744
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
APERTURES; CONTROL; DISTANCE; ERRORS; MIRRORS; OPTICS; SURFACES
Descriptors DEC
OPENINGS