Published March 1975
| Version v1
Journal article
Energy loss spectroscopy applied to surface studies
Creators
- 1. CEA Centre d'Etudes Nucleaires de Saclay, 91 - Gif-sur-Yvette (France). Service de Physique Atomique
Description
The analysis of energy losses suffered by slow electrons (5 eV to 300 eV) back-scattered by single crystal surfaces appears to be a powerful method for surfaces studies. The inelastic scattering of these slow electrons limits their escape depth to the surface region which is defined here. After a review of the basic excitation processes due to the interaction between electrons and surfaces (phonons, plasmons and electronic transitions) a brief discussion is given about the instruments needed for this electron spectroscopy. Finally some experimental results are listed and it is shown that the comparison of the results given by ELS with other surface sensitive methods such as UPS is very fruitful and new information can be obtained
Abstract (French)
L'analyse des pertes d'energie subies par les electrons lents (5eV a 300eV) retrodiffuses par les surfaces des monocristaux apparait comme une puissante methode d'etude des surfaces. La diffusion inelastique de ces electrons lents limite leur profondeur d'echappement a la zone de surface que l'on definit. On analyse les mecanismes fondamentaux d'excitation provenant de l'interaction entre electrons et surfaces (phonons, plasmons et transitions electroniques) et on discute rapidement les instruments necessaires a cette spectroscopie d'electrons. On cite quelques resultats experimentaux et on montre que la comparaison de resultats d'une spectroscopie de pertes d'energie d'electrons avec ceux des autres methodes telle que la mesure de photoemission dans l'UV est tres fructueuse et qu'on peut en tirer de nouvelles informationsAdditional details
Additional titles
- Original title (French)
- Spectroscopie de pertes d'energie d'electrons appliquee a l'etude des surfaces solides
Publishing Information
- Journal Title
- Vide. Couches Minces
- Journal Volume
- 30
- Journal Issue
- 176
- Series
- Vide. Couches Minces.
- Journal Page Range
- 62-69
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 7238348
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BACKSCATTERING; ELECTRON SPECTROSCOPY; ENERGY LOSSES; EV RANGE 01-10; EV RANGE 10-100; EV RANGE 100-1000; SURFACE PROPERTIES
- Descriptors DEC
- ENERGY RANGE; EV RANGE; SCATTERING; SPECTROSCOPY